Analysis of Effect of Surface Roughness of Electrically Conducting Fibre on its Backscattered RCS

Authors

  • Kishan Lal Gadri Defence Laboratory, DRDO, Jodhpur, 342011, INDIA
  • Verandra Kumar Defence Laboratory, DRDO, Jodhpur, 342011, INDIA
  • Ajit Kumar Singh Defence Laboratory, DRDO, Jodhpur, 342011, INDIA
  • Alok Basita Defence Laboratory, DRDO, Jodhpur, 342011, INDIA
  • Prashant Vasistha Defence Laboratory, DRDO, Jodhpur, 342011, INDIA
  • Ravindra Kumar Defence Laboratory, DRDO, Jodhpur, 342011, INDIA

DOI:

https://doi.org/10.32452/IJAMT.2020.237241

Abstract

Presently, chaffs are widely used as electronic counter measure in deceiving tracking radar systems, since they have low production cost and yet they are very effective in creating false radar signatures. These chaffs are designed to cover radar frequency range from 2-18 GHz. However, in future, tracking radars will operate in higher frequency range and will have improved algorithms to mitigate chaff noise of certain Radar Cross Section (RCS) threshold. There are various factors to improve backscattered RCS of the chaff cloud at higher frequencies. In this paper, the effect of surface roughness of electrically conducting fibre (which is used as chaff) on its backscattered RCS has been studied. It has been observed that with an increase in surface roughness of the fibre there is decrease in its backscattered RCS. This relationship between fibre surface roughness and its backscattered RCS were obtained by performing simulations in Ansys HFSS with dipole length of 100mm and 50mm and later validating the same with the measured results for 50mm. Also it has been observed that with increase in frequency range the effect of surface roughness is more pronounce than at the lower frequencies for a given surface roughness range.

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Author Biographies

Kishan Lal Gadri, Defence Laboratory, DRDO, Jodhpur, 342011, INDIA

Kishan Lal Gadri: He did his B.Tech from Jaipur National University, Jaipur in ECE during 2007-2011. He has the experience of 08 years in the field of microwaves and its applications in remote sensing and modelling, simulation and RCS measurement of various electronic countermeasure systems at DRDO.

Verandra Kumar, Defence Laboratory, DRDO, Jodhpur, 342011, INDIA

Verandra Kumar: He did his B Tech from MNIT, Jaipur in ECE during 2005-09. He joined DRDO in 2009 at DL, Jodhpur and currently working as Scientist D. His area of work includes RCS measurement and simulation of tagrets for stealth application, design of elecytronic countermeasure decoys as well as Dynamic RCS modelling, simulation and measurements of decoys currently being used by IAF and IN.

Ajit Kumar Singh, Defence Laboratory, DRDO, Jodhpur, 342011, INDIA

Ajit Kumar Singh: He joined DRDO in 2013 at DL, Jodhpur. He has the experience of 07 years in the area of design and development of software to simulate the parameters of electronic countermeasure and analysis of various chaff decoys used by IAF and IN.

Alok Basita, Defence Laboratory, DRDO, Jodhpur, 342011, INDIA

Alok Basita: He did his B.Tech from MNIT during 2001-2005. He joined DRDO in 2005 and currently working as scientist E at DL, Jodhpur. He has 15 years of experience in design of digital control systems for testing facility of various subsystems related to Gas Turbine Engine, electronic counter measure dispensing system, as well as RCS measurement studies on various targets and decoys suitable for electronic counter measure system.

Prashant Vasistha, Defence Laboratory, DRDO, Jodhpur, 342011, INDIA

Prashant Vasistha: He did his PhD from Department of Electronics Engineering , IIT BHU. He joined DRDO in 1998 at DL, Jodhpur and currently working as Scientist G. He has been working in the area of radar cross section (RCS) management and charectrization studies and RCS measurement technologies for combat systems. He has an experience of 20 years in the area of design and development of radar camouflage techniques and electronic counter measure decoys.

Ravindra Kumar, Defence Laboratory, DRDO, Jodhpur, 342011, INDIA

Ravindra Kumar: He did his BE from IIT Roorkee in 1983 and M Tech from IIT Mumbai in 1987. He joined DRDO in 1983 at DL, Jodhpur and currently working as Outsatnding scientist and Director of estalishment. He has an R&D experience of 37 years in the area of desert warfare scenraio management, Phase change materials, water purifications systems and design, development and testing of electronic countermeasures.

References

B. C. Butters, Chaff, IEE Procedings, vol. 129, no. 3, pp. 197-201, June 1982.

V. Kumar, A. K. Singh, P. Vasistha, and R. Kumar, Dynamic RCS prediction of rapidly blooming chaff cloud and its validation using measurement on scaled down, International Journal of Advances in Microwave Technology (IJAMT), vol. 3, no. 4, pp. 170-175, 2018.

S. W. Marcus, Dynamics and radar cross section density of chaff clouds, IEEE Transaction on Aerospace and Electronic Systems, vol. 40, no. 1, pp. 93-102, 2004.

C. L. Mack and B. Reiffen, RF characteristics of thin dipoles, Proceeding of IEEE, pp. 533-542, 1964.

R. G. Wickliff and R. J. GarBacz, The average backscattering cross section of clouds of randomized resonant dipoles, IEEE Transactions on Antennas and Propagation, vol. 22, no.3, pp. 503-505, 1974.

O. Einarsson and T. Plato, Electromagnetic scattering by a thin resistive wire, Electronic Letters, vol. 5, no. 25, pp. 1019-1025, Dec 1969.

H. T. Shamansky, A. K. Dminek, and L. Peters, Electromagnetic scattering by a straight thin wire, IEEE Transactions on Antennas and Propagation, vol. 37, no. 8, pp. 1019-1025, 1989.

P. Snoeij and P. J. Swart, Theoritical prediction and measurement of the scattering from thin wires with one dimensional random orientation, Proceedings of IGARSS '94, vol. 1, pp. 87-89, 1994.

J. C. Bogerd, A. G. Tijhuis, and J. A. Klaasen, Electromagnetic excitation of a thin wire: a travelling wave approach, IEEE Transaction on Antennas and Propagation, vol. 46, no. 8, pp. 1202-1211, 1998.

Z. Zhou and J. S. Tyo, Transient analysis of straight thin wire scatterer by multiresolution time domain integral equation method, IEEE Antenna and Propagation Society, vol. 3, pp. 575-578, 2003.

Z. Yinan, J. Ming, Q. Xiaolin, and Z. Zhiquan, Study on scattering characteristics of chaff for radar, 4th International Conference on Microwave and Millimeter Wave Technology Proceedings, 2004.

D. Scholfield, M. Myat, J. Dauby, J. Fesler, and J. Bright, A new technique for the characterization of chaff elements, The Review of Scientific Instruments, vol. 82, no. 7, pp. 074702, 2011.

E. F. Knott, Radar Cross Section Fundamentals, Radar Cross Section Measurements, First ed., New York, SciTech, 1993, pp. 14-17.

M. L. Skolnik, Radar Cross Section of Targets, in Introduction to RADAR Systems, Second ed., Tata McGraw Hill, 1981, pp. 33-45.

E. Hammerstad and O. Jensen, Accurate models for microstrip computer-aided design, in IEEE MTT-S Intl. Microwave Symposium Digest, Washington, DC, 1980.

S. Groiss, I. Bardi, O. Biro, K. Preis, and K. R. Richter, Parameters of lossy cavity resonators calculated by the finite element method, IEEE Transactions on Magnetics, vol. 32, no. 3, pp. 894-897, 1996.

S. Hall, S. G. Pytel, P. G. Huray, D. Hua, A. Moonshiram, G. A. Brist, and E. Sijercic, Multigigahertz causal transmission line modeling methodology using a 3-D hemispherical surface roughness approach, IEEE Tranactions on Microwave Theory and Techniques, vol. 55, no. 12, pp. 2614-2624, 2007.

P. G. Huray, O. Oluwafemi, J. Loyer, E. Bogatin, and X. Ye, Impact of copper surface texture on loss: a model that works, DesignCon 2010 Proceedings, Santa Clara, CA, 2010.

Olympus, Performing Measurements, in User Manual Olympus Stream Image Processing Software, Olympus, pp. 48-51.

Ansys Inc., Fundamentals of HFSS, in An Introduction to HFSS, Ansys Inc, 2020, pp. 1-12.

Ansys Inc., Multi Frequency Adaptive Meshing, in An Introduction to Multi Frequency Adaptive Meshing in HFSS, Ansys, Inc., 2017, pp. 1-12.

G. Gold and K. Helmreich, a physical surface roughness model and its applications, IEEE Transaction on Microwave Theory and Techniques, vol. 65, no. 10, pp. 3720-3732, October 2017.

L. Tsang, X. Gu and H. Braunisch, Effect of random rough surface on absorption by conductors at microwave frequencies, IEEE Microwave and Wireless Components Letters vol. 16, no. 4, pp. 221-223, 2006.

Published

2021-02-02

How to Cite

Kishan Lal Gadri, Verandra Kumar, Ajit Kumar Singh, Alok Basita, Prashant Vasistha, & Ravindra Kumar. (2021). Analysis of Effect of Surface Roughness of Electrically Conducting Fibre on its Backscattered RCS. International Journal of Advances in Microwave Technology, 5(4), 237-241. https://doi.org/10.32452/IJAMT.2020.237241